ZEISS 工業用X線CTソリューション
カールツァイスのX線装置でできること
物質を透過する性質のあるX線を利用して製品内部を観察する従来の手法に加えて、精度の保証された寸法計測や独自の光学レンズを用いた超高解像度観察、またそれによって可能になる様々な解析が可能です。
カールツァイスが提供する ZEISS X線ソリューション
計測用X線CT装置(ZEISS METROTOM シリーズ)
![ZEISS METROTOM 1500 G3 計測用X線CT装置 ZEISS METROTOM シリーズ]({"small":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-metrotom-1500-map.ts-1605874284944.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=378%2C8%2C723%2C407&w=640&s=aef060677a507bfc6b5dfdea25683825","large":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-metrotom-1500-map.ts-1605874284944.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=378%2C8%2C723%2C407&w=1280&s=aff484aae73024cf97b32454a8619800","medium":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-metrotom-1500-map.ts-1605874284944.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=378%2C8%2C723%2C407&w=832&s=c8d9b7372c711f7216c8db43a5412125","full":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-metrotom-1500-map.ts-1605874284944.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=378%2C8%2C723%2C407&w=1920&s=87629dd1ed9162e24970e2f2d60f697c"})
世界初、寸法精度保証の計測用X線CT装置
![ZEISS METROTOM 1500 G1 寸法精度を保証した世界初の計測用X線CT装置]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/metrotom/metrotom-1500_800x600.ts-1665636120157.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=8bf7fb0740bd0be4bc447a6ff5392bf3","large":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/metrotom/metrotom-1500_800x600.ts-1665636120157.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=fb5702943b801de1e009e361ad54773d","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/metrotom/metrotom-1500_800x600.ts-1665636120157.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=649c00f5c815cfe63f7f247a29f63265","full":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/metrotom/metrotom-1500_800x600.ts-1665636120157.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=184e4086191883789ba5776e937634f2"})
従来のX線CT装置では内部欠陥の検査と簡易的な測定のみだったが、実際に計測用で使えるCT装置(第一世代モデル)を2006年に発表。
CTの規格であるVDI/VDEに準拠 DAkkS認証
![ZEISS METROTOM 1 VDI/VDEに準拠しDAkks認証されたX線CT装置]({"small":"https://images.zeiss.com/metrology/products/systems/ct/metrotom1/metrotom1.ts-1615383930737.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=171%2C0%2C1440%2C1080&w=640&s=cd2ee4ca5f9632cca13fd03ffe8cbc2d","large":"https://images.zeiss.com/metrology/products/systems/ct/metrotom1/metrotom1.ts-1615383930737.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=171%2C0%2C1440%2C1080&w=1280&s=be889da9ae58ea1d639efdc5f7d597a2","medium":"https://images.zeiss.com/metrology/products/systems/ct/metrotom1/metrotom1.ts-1615383930737.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=171%2C0%2C1440%2C1080&w=832&s=a1d12681609011829d63decd3b6397b9","full":"https://images.zeiss.com/metrology/products/systems/ct/metrotom1/metrotom1.ts-1615383930737.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=171%2C0%2C1440%2C1080&w=1920&s=179e81486e8ac93265504c32d397917d"})
VDI/VDE規格に規定されたすべての寸法精度値を保証。 また、VDI/VDE 2630 part 1.3に基づく部品の客観的で規格に準拠した測定も保証。
従来にない、より微細な内部欠陥を可視化
![ZEISS X線CT装置による高解像度撮影]({"small":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-ct-systems-see-more_3k.ts-1556268614103.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=153%2C33%2C1082%2C812&w=640&s=3f8fb3758caa867bad58d4d53f254ff4","large":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-ct-systems-see-more_3k.ts-1556268614103.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=153%2C33%2C1082%2C812&w=1280&s=501e4b759fe1c0a197772f3e91a2346e","medium":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-ct-systems-see-more_3k.ts-1556268614103.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=153%2C33%2C1082%2C812&w=832&s=0ccf4fda46b16dfda22059c2ca8b2aaa","full":"https://images.zeiss.com/metrology/products/systems/ct/metrotom/zeiss-ct-systems-see-more_3k.ts-1556268614103.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=153%2C33%2C1082%2C812&w=1920&s=a298b5b58e4dab214dac562a873581cd"})
スキャン時間を最大75%短縮。より高い解像度の3Dモデル化を実現。プラスチックから金属まで様々なものを高精度に測定・検査。
X線 顕微鏡(ZEISS Xradia シリーズ)
![ZEISS Xradia 620 Versa X線 顕微鏡 ZEISS Xradia シリーズ]({"small":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=250%2C48%2C1761%2C990&w=640&s=5e5a716635feef0610507efdc45063a7","large":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=250%2C48%2C1761%2C990&w=1280&s=ab4104e95a59caacc0915560d29d8921","medium":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=250%2C48%2C1761%2C990&w=832&s=45bd40fc1f413d7b4f8a759fb92b8286","full":"https://images.zeiss.com/metrology/products/systems/microscopy/zeiss-xradia-versa.ts-1602073779869.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=250%2C48%2C1761%2C990&w=1920&s=18127830f53b5da89333cc41721cf732"})
サブミクロンレベルの最高分解能
![二段階拡大機構 超高分解能観察を可能にする独自の技術である二段階拡大機構]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/raad-zeiss-xrm.ts-1547630572222.ts-1665629657071.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C63%2C1918%2C1080&w=640&s=37cd416712e23778b779e0123098a023","large":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/raad-zeiss-xrm.ts-1547630572222.ts-1665629657071.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C63%2C1918%2C1080&w=1280&s=dd43a8897bf8d73fd4feb5c7e5cfe57f","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/raad-zeiss-xrm.ts-1547630572222.ts-1665629657071.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C63%2C1918%2C1080&w=832&s=1ba4ba5f32b2bd6569064977cec4c0e0","full":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/raad-zeiss-xrm.ts-1547630572222.ts-1665629657071.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C63%2C1918%2C1080&w=1920&s=ea5224beb1e2e9a1022d26f1529fa190"})
非破壊X線技術と光学体系を組み合わせた二段階拡大機構によるサブミクロンレベルでの高分解能観察
高コントラスト視覚化
![高コントラスト視覚化 高コントラスト視覚化]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/high-contrast.ts-1666578389313.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1146%2C645&w=640&s=6f5b61394adf19554e0f4769c630bc4f","large":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/high-contrast.ts-1666578389313.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1146%2C645&w=1280&s=77b8365f8abc528490e395470ae65971","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/high-contrast.ts-1666578389313.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1146%2C645&w=832&s=49dd92cb086ed228a2442c865da9805d","full":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/high-contrast.ts-1666578389313.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1146%2C645&w=1920&s=8c0ddd50684c6e35bcfccafdacd501d7"})
マルチマテリアルサンプルに対しての高コントラスト視覚化
自動測定
![自動測定 X線顕微鏡の自動測定]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/versa-autoloader.ts-1547546411373.ts-1665634018465.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C831%2C468&w=640&s=87d0ef5f4785616942d90c9fc7cc4f29","large":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/versa-autoloader.ts-1547546411373.ts-1665634018465.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C831%2C468&w=1280&s=e0539acf93f00743f5b977b207e9e87a","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/versa-autoloader.ts-1547546411373.ts-1665634018465.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C831%2C468&w=832&s=e7a813086160308fa2e667669abd45a9","full":"https://images.zeiss.com/metrology/jp/img/local-lp/characteristic/xradia/versa-autoloader.ts-1547546411373.ts-1665634018465.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C831%2C468&w=1920&s=f91861e78153f4d9fc8833d30a27eac8"})
オートローダーによる多品種サンプル自動測定により不良解析スピード化
X線技術の用途
- 計測・検査 -
![設計値 / 実測値比較 ZEISS 計測用X線CT装置による設計値 / 実測値比較]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage1.ts-1666579952323.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=59%2C39%2C896%2C504&w=640&s=b7650e9d7d45259b0a48a8be6519f986","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage1.ts-1666579952323.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=59%2C39%2C896%2C504&w=1280&s=35b95d47d8fe7e0d88e6d799f96d0362","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage1.ts-1666579952323.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=59%2C39%2C896%2C504&w=832&s=e3c419c31ab451b1f544a14a45939ebd","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage1.ts-1666579952323.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=59%2C39%2C896%2C504&w=1920&s=35c86975ba88d04ea90d2a41499d5a8a"})
設計値 / 実測値比較
![リバースエンジニアリング リバースエンジニアリング]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage4.ts-1665651564311.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C556%2C417&w=640&s=9de6ccfd67eced5df1fb574a7094e202","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage4.ts-1665651564311.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C556%2C417&w=1280&s=cec56300e1233e03ce56036032fa5976","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage4.ts-1665651564311.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C556%2C417&w=832&s=d70e38cf16c8a12b02d567d41abe6796","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage4.ts-1665651564311.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C556%2C417&w=1920&s=25a2d1e8a270a66dcd820f2ecadb8a2d"})
リバースエンジニアリング
![ZEISS 計測用X線CT装置による寸法管理 ZEISS 計測用X線CT装置による寸法管理]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage2.ts-1666579953247.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=39%2C33%2C1026%2C578&w=640&s=f4b0c4f92a9dc700a161355ad5acd703","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage2.ts-1666579953247.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=39%2C33%2C1026%2C578&w=1280&s=ccf88dbb082b9b1fa699b6e0b9b670f6","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage2.ts-1666579953247.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=39%2C33%2C1026%2C578&w=832&s=e9399000bd4be6aef465751457c2ad79","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage2.ts-1666579953247.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=39%2C33%2C1026%2C578&w=1920&s=e43474e0e511bb9690c718e99e461cb2"})
寸法管理
![欠陥解析 ZEISS 計測用X線CT装置による欠陥解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage5.ts-1665651565491.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=45%2C4%2C841%2C631&w=640&s=433dc51a19b27259c5ea99d42b89addd","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage5.ts-1665651565491.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=45%2C4%2C841%2C631&w=1280&s=e6a4381cd6f0bf10d7741e12d5eb93df","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage5.ts-1665651565491.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=45%2C4%2C841%2C631&w=832&s=c8ed49473ec62833497e149fced7e49a","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage5.ts-1665651565491.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=45%2C4%2C841%2C631&w=1920&s=564c7c11866c653a4d1124b85c02961a"})
欠陥解析
![肉厚解析 ZEISS 計測用X線CT装置による肉厚解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage3.ts-1666579954413.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1132%2C637&w=640&s=2ba15f377257988886484594be8106da","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage3.ts-1666579954413.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1132%2C637&w=1280&s=a5ea73656bbb558e9f583b541c3b896f","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage3.ts-1666579954413.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1132%2C637&w=832&s=bd52e66a8148ea680e3e7f9e0a46be4f","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage3.ts-1666579954413.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1132%2C637&w=1920&s=9bc2efbd9f75353bfd0be095f8b550aa"})
肉厚解析
![接合管理 接合管理]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage6.ts-1666585180166.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1137%2C854&w=640&s=608dfdccede9cfdf48373226c1fff392","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage6.ts-1666585180166.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1137%2C854&w=1280&s=8f87c80239db253cc845ea4b588361b3","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage6.ts-1666585180166.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1137%2C854&w=832&s=a9c9287ef0dd291c389e9fb0f064e17e","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage6.ts-1666585180166.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1137%2C854&w=1920&s=027d207fa85f9c39b0e22bd5426a291b"})
接合管理
- 分析 -
![不良解析 ZEISS X線顕微鏡による不良解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage7.ts-1665651569041.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C878%2C659&w=640&s=5d34190813a921ecd9cf8105d0610680","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage7.ts-1665651569041.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C878%2C659&w=1280&s=b92178ceb59439b95cbf473a8b8df5c8","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage7.ts-1665651569041.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C878%2C659&w=832&s=96ea271d17ad7a96a3bd541723150e1d","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage7.ts-1665651569041.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C878%2C659&w=1920&s=e335422d61990872100d562b3435059e"})
不良解析
![粗さ解析 ZEISS X線顕微鏡による粗さ解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage10.ts-1665651572822.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=5%2C0%2C1026%2C770&w=640&s=f965da86b13443a6ccff02d589078a46","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage10.ts-1665651572822.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=5%2C0%2C1026%2C770&w=1280&s=7ae29855ee400d652c1cc5b373840782","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage10.ts-1665651572822.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=5%2C0%2C1026%2C770&w=832&s=1a480622bc3f715467b4a571e10d41f7","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage10.ts-1665651572822.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=5%2C0%2C1026%2C770&w=1920&s=f8ccc709f227e9d9e2054270f67a20fa"})
粗さ解析
![構造解析 ZEISS X線顕微鏡による構造解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage8.ts-1665651570430.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C1050%2C787&w=640&s=24abcd2064e612faf64d5a951f79ae4b","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage8.ts-1665651570430.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C1050%2C787&w=1280&s=47ae0a41e80f0c2928153367775e4da3","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage8.ts-1665651570430.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C1050%2C787&w=832&s=a01473a298d3d2304a72c35a140fdd62","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage8.ts-1665651570430.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C20%2C1050%2C787&w=1920&s=6072cc2747238ae135f307732d563241"})
構造解析
![繊維複合材解析 ZEISS X線顕微鏡による繊維複合材解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage11.ts-1666584878105.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=3%2C0%2C1360%2C1021&w=640&s=23c4d73a6baa22027061c424147e9460","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage11.ts-1666584878105.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=3%2C0%2C1360%2C1021&w=1280&s=07d7292d54f308bfb05ce4814764e44f","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage11.ts-1666584878105.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=3%2C0%2C1360%2C1021&w=832&s=d9b2ab7f6b81a9e3c664f97c460d07bb","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage11.ts-1666584878105.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=3%2C0%2C1360%2C1021&w=1920&s=39a498998617a792311c60c0003e794c"})
繊維複合材料解析
![In-situ解析 ZEISS X線顕微鏡によるIn-situ解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage9.ts-1665651571477.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C4%2C1064%2C798&w=640&s=ed4c13fae85f582cd15d6750222a5628","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage9.ts-1665651571477.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C4%2C1064%2C798&w=1280&s=aec396b88c756e7e68f82cd5a80e33e8","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage9.ts-1665651571477.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C4%2C1064%2C798&w=832&s=be437804cd0768895873cd94be9b7df8","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage9.ts-1665651571477.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C4%2C1064%2C798&w=1920&s=9817fa32075304376e826c2a3e343f73"})
In-situ & 4D 解析
![粒度分布解析 ZEISS X線顕微鏡による粒度分布解析]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage12.ts-1666584879921.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1298%2C975&w=640&s=61d2eda037b9de44a08dd14c8cae98e0","large":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage12.ts-1666584879921.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1298%2C975&w=1280&s=19e2ad1c48200456707d9a7926ea2637","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage12.ts-1666584879921.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1298%2C975&w=832&s=4400d401c7608dde1294300475f169eb","full":"https://images.zeiss.com/metrology/jp/img/local-lp/usage/usage12.ts-1666584879921.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&rect=0%2C0%2C1298%2C975&w=1920&s=295596366ed3d45e203c92f199c96f48"})
粒度分布解析
ウェビナー録画
![past-webinar 過去のウェビナー録画]({"small":"https://images.zeiss.com/metrology/italy/webinar.ts-1605196331113.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=0abbea4fafab8aaab91b03db993e66d5","large":"https://images.zeiss.com/metrology/italy/webinar.ts-1605196331113.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=be438fbb6d07d93d4adf456c7dc4fe31","medium":"https://images.zeiss.com/metrology/italy/webinar.ts-1605196331113.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=0cfc00adeb1bed433591f8442de79671","full":"https://images.zeiss.com/metrology/italy/webinar.ts-1605196331113.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=581176c01c22d4152cb2ffec62948b64"})
カールツァイスが選ばれる理由
理由 1
光学とオプトエレクトロニクス分野で世界をリード
![zeiss-facility 光学とオプトエレクトロニクス分野で世界をリードするZEISS]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-customer-center.ts-1522138633840.ts-1665726149722.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=3b9edc7f081fd0ed4efb35c822db4e2e","large":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-customer-center.ts-1522138633840.ts-1665726149722.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=0d1d576da5a68f9135ac9738e20bd948","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-customer-center.ts-1522138633840.ts-1665726149722.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=487769a4adfe516b390f612b88acc8e7","full":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-customer-center.ts-1522138633840.ts-1665726149722.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=ac1d9e51c0595e4da4a73c32637b000c"})
カメラ用レンズに限らず、半導体製造装置、三次元測定機、医療機器、双眼鏡などを開発・販売
理由 2
175年以上の歴史と創造の限界への挑戦を続ける企業
![zeiss-portfolio 175年の歴史と創造の限界への挑戦から得た幅広い製品群]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-metrology-heritage.ts-1562917225903.ts-1665726150819.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=a1ffa4477f7d7c509acbc07a6fdd13e8","large":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-metrology-heritage.ts-1562917225903.ts-1665726150819.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=df16ce6f6b6123d36735c5cb4fb98563","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-metrology-heritage.ts-1562917225903.ts-1665726150819.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=ce080e08109e0d8a6c932ca77a24d2f6","full":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-metrology-heritage.ts-1562917225903.ts-1665726150819.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=03ac5a9ceed7d8cf0a0e0a629ed3c838"})
世界で35,000人、100拠点でのサービス・販売体制
2021年度連結売上高は約1兆円
理由 3
最先端技術への好奇心、情熱、より高度な精密さを追求
![R&D 売上高の14%である1400億円を投資する研究開発]({"small":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-innovation-special-metrology-magazine.ts-1523540465207.ts-1665726149961.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=b7630dd716485f92a3962bdb53f27b41","large":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-innovation-special-metrology-magazine.ts-1523540465207.ts-1665726149961.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=de8636117e2bf80844094f5f1270f8d6","medium":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-innovation-special-metrology-magazine.ts-1523540465207.ts-1665726149961.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=2f300d21c07c66c80d532557588b55fe","full":"https://images.zeiss.com/metrology/jp/img/local-lp/company/zeiss-innovation-special-metrology-magazine.ts-1523540465207.ts-1665726149961.png?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=aa3ca7f6d4184067f954739ddc84cfe9"})
年間売上高の約14%にあたる1400億円を研究開発に投資