Connected microscopy.

意思決定を加速します。

工業用顕微鏡シリーズ

170年の経験とすべてのデバイスにわたる比類のないデータ処理機能：アプリケーション指向の接続型工業用顕微鏡ソリューションの包括的なポートフォリオを備えたZEISSは、データを実用的な情報に変換し、正しい判断を迅速に下すお手伝いをします。

From micrometer to nanometer

ZEISS delivers a uniquely comprehensive portfolio of all microscope types relevant for industrial applications. This, combined with the correlatable data across the various microscope technologies and the workflow-oriented ZEN core software, provides customers with a complete and coherent solution system that only ZEISS can offer.

Light/Confocal

ZEISS SteREO Discovery

ZEISS Stemi 305 / 508

Go from largest overview into the smallest details

ZEISS Axio Imager 2

ZEISS Axioscope Family

ZEISS Axiolab 5

Be open for advanced materials research

ZEISS Axio Zoom.V16

ZEISS Smartzoom 5

ZEISS Visioner 1

Reduce image acquisition times to speed up analysis

X-Ray Microscopy

ZEISS Xradia Versa Series

Industrial X-Ray microscopy: Extreme resolution & contrast

Light/Confocal

ZEISS Smartproof 5

ZEISS LSM 900

Fast and robust confocal technology for trusted results

Scanning Electron

ZEISS EVO

Best qualified SEM to support industrial quality and failure analysis

ZEISS GeminiSEM

ZEISS Sigma

Field emission SEM for the highest demands in imaging and analytics

ZEISS Crossbeam

FIB-SEM for high throughput 3D analysis and sample preparation

From image analysis to productivity

次元を超えたデータ処理

「ZEISS工業用顕微鏡シリーズにより、ZEISSは、多様なアプリケーションに対応するそれぞれの顕微鏡により一貫して顕微鏡データの取得、管理、利用等でお客様をサポートします。

これにより、ユーザーに依存しない操作、データの分析、測定およびモダリティ全体の結果の組み合わせ、そしてデータの共有を通じてより深い洞察が可能となります。その結果、産業用顕微鏡アプリケーションにおける生産性と精度を向上させます。」

目視検査の合否
欠陥や故障の特定とその根本原因の特定
粗さとトポグラフィーの特定
コンタミ粒子のトラッキング
寸法測定

データの取り扱い

相関顕微鏡法

ZENコアの統合されたユーザーインターフェースにより、ユーザーは実体顕微鏡から完全に自動化されたハイエンドアプリケーションまで、顕微鏡を同じように操作できます。強力なソフトウェアスイートにより、マルチモーダルワークフローでの光学顕微鏡と電子顕微鏡の相関が可能になり、システム、部門、場所間の接続が可能になります。 ZENコアは、顕微鏡イメージングだけではありません。接続された材料ラボのマルチモーダル顕微鏡用のイメージング、セグメンテーション、分析、データ接続ツールの最も包括的なスイートです。

Get to know our microscopy software suite!

Workflow-oriented

ZEN core enables a workflow-oriented quality assurance for microscopy applications through dedicated
software modules for application fields such as technical cleanliness analysis and job templates for automated image quantification.

ZEISS ZEN core

Mobile Access

ZEN Data Explorer allows access to all data on the central ZEN Data Storage from any place via mobile device or browser.

ZEISS ZEN core

Reliable Data Storage

The central database for secure data handling and documentation offers a scalable central storage solution for results, methods, and templates.

ZEISS ZEN core

Correlation and Connectivity

Through its correlative data output, ZEN core allows quick and easy re-localization of area of interests across different imaging methods and microscope technologies.

Learn More

Third-Party Import

Users can integrate and process third-party images, even from third-party microscopes.

See how other customers use solutions for Industrial Microscopy from ZEISS

ZEISS Solutions for metallography and materialography.

Find out here how SPC Werkstofflabor GmbH supports its customers in the steel industry with a combination of light and scanning electron microscopy from ZEISS.

ZEISS solution for Technical Cleanliness: ZEISS EVO.

INNIO group analyzes the chemical composition of residual dirt particles using scanning electron microscope ZEISS EVO.

ZEISS solutions for e-mobility.

Read the customer story: E-drive trains are created with production technology. GROB ensures quality standards with quality solutions from ZEISS.

Applications for Industrial Microscopy Systems

Workflow-oriented solutions for efficient quality analysis

ZEISS delivers the broadest range of solutions for industrial applications in various industrial segments: electronics, automotive, aerospace, medical equipment and additive manufacturing. Partner with us to solve your specific technological problems, advance your processes and minimize your time-to-result using our comprehensive microscopy portfolio and targeted software solutions. Achieve high quality imaging with our unique microscopy solutions using light, X-Ray and electron imaging modalities.

Failure Analysis and Metallography

Determining the root cause of failure

The Challenge

Metallography reveals the internal structure of materials. In case something does not go as planned, failure analysis is needed to inspect, analyze, and document the failure to reveal the underlying root cause.

Your benefit with ZEISS

Faster time-to-result through workflow-oriented software and correlation of results with ZEN core.

Visual Inspection

Fast and repeatable

The Challenge

Optical inspection offers manufacturers the ability to catch and stop errors the moment they appear. It relies on fast and repeatable images and reliable documentation at the shop floor and in quality departments.

Your benefit with ZEISS

ZEISS offers the right microscopy solution for every inspection application: Light microscopes, Scanning electron microscopes and X-Ray microscopes.

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Optical Measurement

Precise metrology at a microscopic scale

The Challenge

As production technology progresses, manufacturing tools are able to produce features with ambitious tolerances on work pieces. To assure the quality of these products and components, manufacturers need to measure in dimensions smaller than a human eye can see.

Your benefit with ZEISS

ZEISS’s unmatched experience in microscopy and its extensive know-how in metrology delivers accurate results with a broad range of microscope types.

Surface Characterization

3D topography and roughness

The Challenge

Finished and functional surfaces with a complex geometry need to be characterized for roughness and three-dimensional topography with highest precision.

Your benefit with ZEISS

Depending on the application requirement, ZEISS can offer tactile options in addition to class-leading microscopy solutions like the ZEISS LSM 900 MAT and ZEISS Smartproof 5.

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Particle Analysis

Reliable quality assurance for technical cleanliness

The Challenge

The cleanliness of components and parts is at the center of most industrial manufacturing processes. Undiscovered particulate contamination may affect the performance, lifetime, and reliability of final products.

Your benefit with ZEISS

ZEISS enables you to make informed decisions about the root cause of contamination.

Learn more

産業用顕微鏡システムのアプリケーション

効率的な品質分析のためのワークフロー指向のソリューション

ZEISSは、電子機器、自動車、航空宇宙、医療機器、積層造形など、さまざまな産業分野の産業用アプリケーションに幅広いソリューションを提供します。包括的な顕微鏡ポートフォリオと対象を絞ったソフトウェアソリューションを使用して、特定の技術的問題を解決し、プロセスを進め、結果が出るまでの時間を最小限に抑えることが可能となります。光学、X線、電子のイメージングモダリティを使用した独自の顕微鏡ソリューションで高品質のイメージングを実現します。