ZEISS ABIS III

Automated Surface Inspection
for Smart Factories

Process Monitoring in Cycle Time

The newly developed ZEISS ABIS III sensor combines high-speed inspection with a reliable detection of all relevant surface defects such as dents, bulges, sink marks, ripples, neckings, cracks and now also scratches and pressure marks. The system inspects both moving and stationary parts reproducibly and highly precise during live production and within the cycle time. Moreover, it is not only suited for in-line but also for at-line use in the production environment.

The patented Multi-Color-Light technology allows for detecting even the smallest defects. After only a few seconds, a digital inspection report will be issued. This way, functions such as a Q-stop and digital quality details such as defect visualizations for scheduled rework are always available. They provide the basis for closed loop circuits and the precondition for implementing the Smart Process Control. Designed and developed in Germany to fulfill the highest quality standards, ZEISS ABIS III is the ideal solution for both modern press shops and future-oriented body shops.

Continuous Analysis of the Surface Quality Throughout the Complete Process Chain

Surface Inspection

The conventional surface inspection, e.g., treating the surface with grindstones, takes a lot of time and depends on the relevant user. This subjective inspection may cause disagreements between customer and supplier and consequently complaints, claims or costly sorting or reworking tasks. With the use of the sensor ZEISS ABIS III and the fast defect detection rate of up 20 Hz, manual and subjective quality assurance processes become redundant. The resource-efficient system continuously and automatically provides the database required for dedicated rework, quick surface analyses and efficient process optimizations.

Optical surface inspection sensor ZEISS ABIS II detects a wide range of defect types
Optical surface inspection sensor ZEISS ABIS II detects a wide range of defect types

Multi-Color-Light Technology to Detect Smallest Defects

The uncompromising ZEISS ABIS III surface inspection system combines high-speed inspection with reliable defect detection in accordance with the 100% principle: 100% inspection of all parts produced, the entire surface and all relevant types of defects. One of the technical highlights in this context is the newly developed MCL module. The patented Multi-Color-Light technology enables detecting the smallest types of defects.

Defect Visualization and Digital Inspection Reports in ZEISS ABIS V20

In combination with the ZEISS ABIS V20 software, surface characteristics are detected within seconds and evaluated according to the specifications of individual corporate standards. The software visualizes types of defects such as dents, bulges, ripples, neckings and skid lines in real time and digitally stores the inspection results in a database. Thus, the quality certificate for the customers is available and retrievable at any time. The evaluation of determined defect hot spots facilitates a quick root cause analysis and, on its basis, the definition of targeted corrective actions.

Optical surface inspection sensor ZEISS ABIS II detects a wide range of defect types

Offline creation of test programs in the virtual robot cell

With ZEISS ABIS Planner new test programs can be created and added in four steps without interrupting ongoing production processes. The creation of the virtual robot cell is possible as a true to scale 3D model by importing CAD data or using standard geometries.

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Mobile Measurement and Inspection Cells Brochure EN

Mobile Measurement and Inspection Cells Brochure EN
ページ: 9
ファイルサイズ: 14839 kB

ZEISS ABIS III Digital Brochure EN

ZEISS ABIS III Digital Brochure EN
ページ: 8
ファイルサイズ: 660 kB

ZEISS ABIS Planner brochure digital EN

ZEISS ABIS Planner brochure digital EN
ページ: 7
ファイルサイズ: 3440 kB